Plating Risk Estimation
PRISM uses routinely measurable terminal signals—current and voltage, with temperature incorporated where available—to reconstruct electrochemical conditions that cannot be measured directly inside the cell.
The left panels show the spatial distribution of plating risk through the negative electrode during 1C and 2C charging.
We define the local electrochemical margin as
$$
M_{\mathrm{pl}}(x,t)
=
\phi_{\mathrm{s,n}}(x,t)-\phi_{\mathrm{e}}(x,t),
$$
and the displayed risk margin as
$$
M_{\mathrm{risk}}(x,t)
=
M_{\mathrm{pl}}(x,t)-M_{\mathrm{crit}},
$$
where \(M_{\mathrm{crit}}\) is an onset criterion to be specified.
The red dashed lines denote \(M_{\mathrm{risk}}=0\); lower values indicate greater susceptibility to lithium plating.
The right panel compares PRISM's estimate of the minimum margin, \(\min_{x} M_{\mathrm{risk}}(x,t)\), with hidden high-fidelity DFN truth.
In this synthetic test, only current and terminal voltage were supplied to the estimator, and PRISM tracks the hidden minimum margin with an RMSE of \(0.59\,\mathrm{mV}\).
During the higher-rate charge, the onset criterion is reached first near the separator.
Internal temperature and plating-risk fields were withheld during fitting.
The criterion is configurable and is used here to visualise risk.